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transmission electron backscatter diffraction  (Bruker Corporation)


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    Bruker Corporation transmission electron backscatter diffraction
    Transmission Electron Backscatter Diffraction, supplied by Bruker Corporation, used in various techniques. Bioz Stars score: 96/100, based on 382 PubMed citations. ZERO BIAS - scores, article reviews, protocol conditions and more
    https://www.bioz.com/product/electron+backscatter+diffraction+ebsd/QUANTAX+EBSD/10__1016_slash_j__matchar__2026__116732-91-11-16
    Average 96 stars, based on 382 article reviews
    transmission electron backscatter diffraction - by Bioz Stars, 2026-11
    96/100 stars

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    Related Articles

    Microscopy:

    Article Title: Anomalously strong size effect on thermal conductivity of diamond microparticles
    Article Snippet: The optical microscope images were taken with Olympus SZX16. .. The scanning electron microscope (SEM) and electron backscatter diffraction (EBSD) were measured by Bruker QUANTAX CrystAlign 400i. ..

    other:

    Article Title: [2405.03670] Harnessing metastability for grain size control in multiprincipal element alloys during additive manufacturing
    Article Snippet: Imaging and electron dispersive spectroscopy (EDS) were conducted on a Tescan Mira3 field-emission scanning electron microscope (FE-SEM) equipped with a backscattering detector.

    Article Title: Degradation of mechanical properties of MgO-spinel bricks after pre-treatment in hydrogen-containing atmospheres at different temperatures
    Article Snippet: Moreover, phase analysis was also performed on the specimens after dilatometry measurements (maximum temperature of 1400 °C) using F. Kerber et al. Journal of the European Ceramic Society 45 (2025) 116827 electron backscatter diffraction EBSD (Bruker Nano GmbH, Berlin, Germany) in combination with an SEM AMBER (Tescan, Brno, Czech Republic) coupled with EDS (Bruker Nano GmbH, Berlin, Germany).

    Morphology:

    Article Title: Role of grain refinement and phase metastability on deformation behavior of additively manufactured FeMnCoCr multiprincipal element alloys
    Article Snippet: This study investigates the deformation mechanisms of three additively manufactured FeMnCoCr multiprincipal element alloys (MPEAs), each with distinct grain sizes achieved through metastability engineering and unique deformation mechanisms.. The Fe35Mn45Co10Cr10 composition serves as a baseline for comparison, exhibiting intermediate mechanical properties and deformation primarily through slip.. In contrast, the Fe40Mn40Co10Cr10 composition relies on twinning mechanisms to accommodate strain and enhance work hardening.



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    Image Search Results


    EBSD analysis of the T6-treated AC alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Journal: Materials

    Article Title: Evolution of the Young’s Modulus of Al-7Si-4Cu Alloy with Increasing Temperature by Various Strengthening Approaches

    doi: 10.3390/ma19091831

    Figure Lengend Snippet: EBSD analysis of the T6-treated AC alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Article Snippet: Electron backscatter diffraction (EBSD) analysis was performed using a JEOL JSM-7800F SEM (Japan Electron Optics Laboratory Co., Ltd., Tokyo, Japan) to characterize the grain size, crystallographic orientation, grain boundary (GB) distribution, and recrystallized fraction (RF).

    Techniques:

    EBSD analysis of the T6-treated AE alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Journal: Materials

    Article Title: Evolution of the Young’s Modulus of Al-7Si-4Cu Alloy with Increasing Temperature by Various Strengthening Approaches

    doi: 10.3390/ma19091831

    Figure Lengend Snippet: EBSD analysis of the T6-treated AE alloy: ( a ) grain orientation and size distribution of α-Al grains; ( b ) corresponding PFs; ( c ) GB analysis; ( d ) RF analysis.

    Article Snippet: Electron backscatter diffraction (EBSD) analysis was performed using a JEOL JSM-7800F SEM (Japan Electron Optics Laboratory Co., Ltd., Tokyo, Japan) to characterize the grain size, crystallographic orientation, grain boundary (GB) distribution, and recrystallized fraction (RF).

    Techniques: